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Bayesian inference for multi-label classification for root cause analysis and probe card maintenance decision support and an empirical study.

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Title: Bayesian inference for multi-label classification for root cause analysis and probe card maintenance decision support and an empirical study.
Authors: Chien, Chen-Fu1,2,3, cfchien@mx.nthu.edu.tw, Peng, Jia-Yu1
Source: Journal of Intelligent Manufacturing; Mar2025, Vol. 36 Issue 3, p1943-1958, 16p
Database: Applied Science & Technology Source
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        Value: 10.1007/s10845-024-02336-z
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      – Code: eng
        Text: English
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        PageCount: 16
        StartPage: 1943
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      – TitleFull: Bayesian inference for multi-label classification for root cause analysis and probe card maintenance decision support and an empirical study.
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            NameFull: Chien, Chen-Fu
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            – D: 01
              M: 03
              Text: Mar2025
              Type: published
              Y: 2025
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              Value: 36
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