APA (7th ed.) Citation

Baek, I., Hwang, S. J., & Kim, S. B. (2025). CowSSL: Contrastive open-world semi-supervised learning for wafer bin map. Journal of Intelligent Manufacturing, 36(3), 2163. https://doi.org/10.1007/s10845-024-02351-0

Chicago Style (17th ed.) Citation

Baek, Insung, Sung Jin Hwang, and Seoung Bum Kim. "CowSSL: Contrastive Open-world Semi-supervised Learning for Wafer Bin Map." Journal of Intelligent Manufacturing 36, no. 3 (2025): 2163. https://doi.org/10.1007/s10845-024-02351-0.

MLA (9th ed.) Citation

Baek, Insung, et al. "CowSSL: Contrastive Open-world Semi-supervised Learning for Wafer Bin Map." Journal of Intelligent Manufacturing, vol. 36, no. 3, 2025, p. 2163, https://doi.org/10.1007/s10845-024-02351-0.