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CowSSL: contrastive open-world semi-supervised learning for wafer bin map.

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Title: CowSSL: contrastive open-world semi-supervised learning for wafer bin map.
Authors: Baek, Insung1, insung_baek01@korea.ac.kr, Hwang, Sung Jin2, sj90.hwang@samsung.com, Kim, Seoung Bum1, sbkim1@korea.ac.kr
Source: Journal of Intelligent Manufacturing; Mar2025, Vol. 36 Issue 3, p2163-2175, 13p
Database: Applied Science & Technology Source
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Header DbId: aci
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PubTypeId: academicJournal
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  Data: <searchLink fieldCode="AU" term="%22Baek%2C+Insung%22">Baek, Insung</searchLink><relatesTo>1</relatesTo>, <i>insung_baek01@korea.ac.kr</i><br /><searchLink fieldCode="AU" term="%22Hwang%2C+Sung+Jin%22">Hwang, Sung Jin</searchLink><relatesTo>2</relatesTo>, <i>sj90.hwang@samsung.com</i><br /><searchLink fieldCode="AU" term="%22Kim%2C+Seoung+Bum%22">Kim, Seoung Bum</searchLink><relatesTo>1</relatesTo>, <i>sbkim1@korea.ac.kr</i>
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      – Type: doi
        Value: 10.1007/s10845-024-02351-0
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      – Code: eng
        Text: English
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        PageCount: 13
        StartPage: 2163
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      – TitleFull: CowSSL: contrastive open-world semi-supervised learning for wafer bin map.
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            NameFull: Baek, Insung
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            NameFull: Hwang, Sung Jin
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            – D: 01
              M: 03
              Text: Mar2025
              Type: published
              Y: 2025
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              Value: 36
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