APA (7th ed.) Citation

Gong, T., Chen, L., Wang, X., Qiu, Y., Liu, H., Yang, Z., & Walther, T. (2025). Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures. Crystals (2073-4352), 15(2), 192. https://doi.org/10.3390/cryst15020192

Chicago Style (17th ed.) Citation

Gong, Tao, Longqing Chen, Xiaoyi Wang, Yang Qiu, Huiyun Liu, Zixing Yang, and Thomas Walther. "Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures." Crystals (2073-4352) 15, no. 2 (2025): 192. https://doi.org/10.3390/cryst15020192.

MLA (9th ed.) Citation

Gong, Tao, et al. "Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures." Crystals (2073-4352), vol. 15, no. 2, 2025, p. 192, https://doi.org/10.3390/cryst15020192.