View in EDS PDF Full Text

Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures.

Saved in:
Bibliographic Details
Title: Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures.
Authors: Gong, Tao1, 80300024@swun.edu.cntaogong80@gmail.com, Chen, Longqing2, chenlongqing@scu.edu.cn, Wang, Xiaoyi3, chenlongqing@scu.edu.cn, Qiu, Yang4, chenlongqing@scu.edu.cnqiuy@sustech.edu.cn, Liu, Huiyun5, huiyun.liu@ucl.ac.uk, Yang, Zixing1, yzx15188955520@163.com, Walther, Thomas6, t.walther@sheffield.ac.uk
Source: Crystals (2073-4352); Feb2025, Vol. 15 Issue 2, p192, 57p
Database: Applied Science & Technology Source
FullText Links:
  – Type: pdflink
Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 183335750
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Gong%2C+Tao%22">Gong, Tao</searchLink><relatesTo>1</relatesTo>, <i>80300024@swun.edu.cntaogong80@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Chen%2C+Longqing%22">Chen, Longqing</searchLink><relatesTo>2</relatesTo>, <i>chenlongqing@scu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wang%2C+Xiaoyi%22">Wang, Xiaoyi</searchLink><relatesTo>3</relatesTo>, <i>chenlongqing@scu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Qiu%2C+Yang%22">Qiu, Yang</searchLink><relatesTo>4</relatesTo>, <i>chenlongqing@scu.edu.cnqiuy@sustech.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Liu%2C+Huiyun%22">Liu, Huiyun</searchLink><relatesTo>5</relatesTo>, <i>huiyun.liu@ucl.ac.uk</i><br /><searchLink fieldCode="AU" term="%22Yang%2C+Zixing%22">Yang, Zixing</searchLink><relatesTo>1</relatesTo>, <i>yzx15188955520@163.com</i><br /><searchLink fieldCode="AU" term="%22Walther%2C+Thomas%22">Walther, Thomas</searchLink><relatesTo>6</relatesTo>, <i>t.walther@sheffield.ac.uk</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Crystals+%282073-4352%29%22">Crystals (2073-4352)</searchLink>; Feb2025, Vol. 15 Issue 2, p192, 57p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=183335750
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.3390/cryst15020192
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 57
        StartPage: 192
    Titles:
      – TitleFull: Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Gong, Tao
      – PersonEntity:
          Name:
            NameFull: Chen, Longqing
      – PersonEntity:
          Name:
            NameFull: Wang, Xiaoyi
      – PersonEntity:
          Name:
            NameFull: Qiu, Yang
      – PersonEntity:
          Name:
            NameFull: Liu, Huiyun
      – PersonEntity:
          Name:
            NameFull: Yang, Zixing
      – PersonEntity:
          Name:
            NameFull: Walther, Thomas
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 02
              Text: Feb2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 20734352
          Numbering:
            – Type: volume
              Value: 15
            – Type: issue
              Value: 2
          Titles:
            – TitleFull: Crystals (2073-4352)
              Type: main
ResultId 1