Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures.
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| Title: | Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures. |
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| Authors: | Gong, Tao1, 80300024@swun.edu.cntaogong80@gmail.com, Chen, Longqing2, chenlongqing@scu.edu.cn, Wang, Xiaoyi3, chenlongqing@scu.edu.cn, Qiu, Yang4, chenlongqing@scu.edu.cnqiuy@sustech.edu.cn, Liu, Huiyun5, huiyun.liu@ucl.ac.uk, Yang, Zixing1, yzx15188955520@163.com, Walther, Thomas6, t.walther@sheffield.ac.uk |
| Source: | Crystals (2073-4352); Feb2025, Vol. 15 Issue 2, p192, 57p |
| Database: | Applied Science & Technology Source |
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