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High‐voltage electron microscopy analyses for crack‐tip dislocations and their shielding effect on fracture toughness in MgO and Si crystals.

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Bibliographic Details
Title: High‐voltage electron microscopy analyses for crack‐tip dislocations and their shielding effect on fracture toughness in MgO and Si crystals.
Authors: Higashida, Kenji1, higashida.kenji.249@m.kyushu-u.ac.jp, Sadamatsu, Sunao2, Tanaka, Masaki1
Source: Journal of the American Ceramic Society; Jun2025, Vol. 108 Issue 6, p1-12, 12p
Database: Applied Science & Technology Source
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ISSN:00027820
DOI:10.1111/jace.20378