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High‐voltage electron microscopy analyses for crack‐tip dislocations and their shielding effect on fracture toughness in MgO and Si crystals.

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Title: High‐voltage electron microscopy analyses for crack‐tip dislocations and their shielding effect on fracture toughness in MgO and Si crystals.
Authors: Higashida, Kenji1, higashida.kenji.249@m.kyushu-u.ac.jp, Sadamatsu, Sunao2, Tanaka, Masaki1
Source: Journal of the American Ceramic Society; Jun2025, Vol. 108 Issue 6, p1-12, 12p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 184273604
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PubType: Academic Journal
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: High‐voltage electron microscopy analyses for crack‐tip dislocations and their shielding effect on fracture toughness in MgO and Si crystals.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Higashida%2C+Kenji%22">Higashida, Kenji</searchLink><relatesTo>1</relatesTo>, <i>higashida.kenji.249@m.kyushu-u.ac.jp</i><br /><searchLink fieldCode="AU" term="%22Sadamatsu%2C+Sunao%22">Sadamatsu, Sunao</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Tanaka%2C+Masaki%22">Tanaka, Masaki</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+the+American+Ceramic+Society%22">Journal of the American Ceramic Society</searchLink>; Jun2025, Vol. 108 Issue 6, p1-12, 12p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=184273604
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1111/jace.20378
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 12
        StartPage: 1
    Titles:
      – TitleFull: High‐voltage electron microscopy analyses for crack‐tip dislocations and their shielding effect on fracture toughness in MgO and Si crystals.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Higashida, Kenji
      – PersonEntity:
          Name:
            NameFull: Sadamatsu, Sunao
      – PersonEntity:
          Name:
            NameFull: Tanaka, Masaki
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 06
              Text: Jun2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 00027820
          Numbering:
            – Type: volume
              Value: 108
            – Type: issue
              Value: 6
          Titles:
            – TitleFull: Journal of the American Ceramic Society
              Type: main
ResultId 1