Machine-learning-enabled on-the-fly analysis of RHEED patterns during thin film deposition by molecular beam epitaxy. - Kaspar, Tiffany C.; Akers, Sarah; Sprueill, Henry W.; Ter-Petrosyan, Arman H.; Bilbrey, Jenna A.; Hopkins, Derek; Harilal, Ajay; Christudasjustus, Jijo; Gemperline, Patrick; Comes, Ryan B. (Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films, 2025)