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JOG: Java JIT Peephole Optimizations and Tests from Patterns.

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Bibliographic Details
Title:	JOG: Java JIT Peephole Optimizations and Tests from Patterns.
Authors:	Zang, Zhiqiang¹, zhiqiang.zang@utexas.edu, Thimmaiah, Aditya¹, auditt@utexas.edu, Gligoric, Milos¹, gligoric@utexas.edu
Source:	ICSE: International Conference on Software Engineering; 2024, p11-15, 5p
Database:	Applied Science & Technology Source
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Description
DOI:	10.1145/3639478.3640040