APA (7th ed.) Citation

Soundarya, T. L., Prasad, B. T. J., Sanjay, J., Nirmala, B., Shkir, M., Nagaraju, G., & Harini, R. (2025). The influence of Ni impurities on the structural phase of BiVO4 for enhanced binder-free voltammetric vanillin sensing, photocatalysis, and latent fingerprint studies. Journal of Materials Science: Materials in Electronics, 36(14), 1. https://doi.org/10.1007/s10854-025-14876-y

Chicago Style (17th ed.) Citation

Soundarya, T. L., B. T. Jyothi Prasad, J. Sanjay, B. Nirmala, Mohd Shkir, G. Nagaraju, and R. Harini. "The Influence of Ni Impurities on the Structural Phase of BiVO4 for Enhanced Binder-free Voltammetric Vanillin Sensing, Photocatalysis, and Latent Fingerprint Studies." Journal of Materials Science: Materials in Electronics 36, no. 14 (2025): 1. https://doi.org/10.1007/s10854-025-14876-y.

MLA (9th ed.) Citation

Soundarya, T. L., et al. "The Influence of Ni Impurities on the Structural Phase of BiVO4 for Enhanced Binder-free Voltammetric Vanillin Sensing, Photocatalysis, and Latent Fingerprint Studies." Journal of Materials Science: Materials in Electronics, vol. 36, no. 14, 2025, p. 1, https://doi.org/10.1007/s10854-025-14876-y.