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The influence of Ni impurities on the structural phase of BiVO4 for enhanced binder-free voltammetric vanillin sensing, photocatalysis, and latent fingerprint studies.

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Title: The influence of Ni impurities on the structural phase of BiVO4 for enhanced binder-free voltammetric vanillin sensing, photocatalysis, and latent fingerprint studies.
Authors: Soundarya, T. L.1, Prasad, B. T. Jyothi1, Sanjay, J.1, Nirmala, B.1, nirmala2528@gmail.com, Shkir, Mohd2, Nagaraju, G.3, nagarajugn@sit.ac.in, Harini, R.4
Source: Journal of Materials Science: Materials in Electronics; May2025, Vol. 36 Issue 14, p1-30, 30p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 185674984
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: The influence of Ni impurities on the structural phase of BiVO4 for enhanced binder-free voltammetric vanillin sensing, photocatalysis, and latent fingerprint studies.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; May2025, Vol. 36 Issue 14, p1-30, 30p
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      – Type: doi
        Value: 10.1007/s10854-025-14876-y
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      – Code: eng
        Text: English
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        PageCount: 30
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      – TitleFull: The influence of Ni impurities on the structural phase of BiVO4 for enhanced binder-free voltammetric vanillin sensing, photocatalysis, and latent fingerprint studies.
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            NameFull: Soundarya, T. L.
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            NameFull: Prasad, B. T. Jyothi
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            NameFull: Sanjay, J.
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            NameFull: Nirmala, B.
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            NameFull: Shkir, Mohd
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            – D: 11
              M: 05
              Text: May2025
              Type: published
              Y: 2025
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            – TitleFull: Journal of Materials Science: Materials in Electronics
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