The influence of Ni impurities on the structural phase of BiVO4 for enhanced binder-free voltammetric vanillin sensing, photocatalysis, and latent fingerprint studies.
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| Title: | The influence of Ni impurities on the structural phase of BiVO4 for enhanced binder-free voltammetric vanillin sensing, photocatalysis, and latent fingerprint studies. |
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| Authors: | Soundarya, T. L.1, Prasad, B. T. Jyothi1, Sanjay, J.1, Nirmala, B.1, nirmala2528@gmail.com, Shkir, Mohd2, Nagaraju, G.3, nagarajugn@sit.ac.in, Harini, R.4 |
| Source: | Journal of Materials Science: Materials in Electronics; May2025, Vol. 36 Issue 14, p1-30, 30p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 09574522 |
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| DOI: | 10.1007/s10854-025-14876-y |
