Mohapatra, S., Abhangi, M., Vala, S., Sahu, P. K., & Murty, N. V. L. N. (2025). Characterization of Electrically and Optically Active Defects in Synthetic Single-Crystal Diamond-Based Radiation Detectors. Journal of Electronic Materials, 54(7), 6004. https://doi.org/10.1007/s11664-025-11973-w
Chicago Style (17th ed.) CitationMohapatra, Sarthak, Mitul Abhangi, Sudhirsinh Vala, Prasant Kumar Sahu, and N. V. L. Narasimha Murty. "Characterization of Electrically and Optically Active Defects in Synthetic Single-Crystal Diamond-Based Radiation Detectors." Journal of Electronic Materials 54, no. 7 (2025): 6004. https://doi.org/10.1007/s11664-025-11973-w.
MLA (9th ed.) CitationMohapatra, Sarthak, et al. "Characterization of Electrically and Optically Active Defects in Synthetic Single-Crystal Diamond-Based Radiation Detectors." Journal of Electronic Materials, vol. 54, no. 7, 2025, p. 6004, https://doi.org/10.1007/s11664-025-11973-w.