APA (7th ed.) Citation

Karmakar, S., Azmain, M. A., Adedayo, A., Manikanthababu, N., Emu, I. H., Droopad, R., . . . Haque, A. (2025). Charge carrier trapping and current conduction mechanisms in ZnGa2O4/n-SrTiO3 MOS capacitors. Journal of Materials Science: Materials in Electronics, 36(18), 1. https://doi.org/10.1007/s10854-025-15163-6

Chicago Style (17th ed.) Citation

Karmakar, Subrata, Mahfuz Ahmed Azmain, Alaga Adedayo, Nethala Manikanthababu, Injamamul Hoque Emu, Ravi Droopad, Yihong Chen, and Ariful Haque. "Charge Carrier Trapping and Current Conduction Mechanisms in ZnGa2O4/n-SrTiO3 MOS Capacitors." Journal of Materials Science: Materials in Electronics 36, no. 18 (2025): 1. https://doi.org/10.1007/s10854-025-15163-6.

MLA (9th ed.) Citation

Karmakar, Subrata, et al. "Charge Carrier Trapping and Current Conduction Mechanisms in ZnGa2O4/n-SrTiO3 MOS Capacitors." Journal of Materials Science: Materials in Electronics, vol. 36, no. 18, 2025, p. 1, https://doi.org/10.1007/s10854-025-15163-6.