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Charge carrier trapping and current conduction mechanisms in ZnGa2O4/n-SrTiO3 MOS capacitors.

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Bibliographic Details
Title: Charge carrier trapping and current conduction mechanisms in ZnGa2O4/n-SrTiO3 MOS capacitors.
Authors: Karmakar, Subrata1,2, skarmakarph@gmail.com, Azmain, Mahfuz Ahmed1, Adedayo, Alaga1, Manikanthababu, Nethala1, Emu, Injamamul Hoque1, Droopad, Ravi1,3, Chen, Yihong1, Haque, Ariful1,3, ahaque@txstate.edu
Source: Journal of Materials Science: Materials in Electronics; Jun2025, Vol. 36 Issue 18, p1-15, 15p
Database: Applied Science & Technology Source
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ISSN:09574522
DOI:10.1007/s10854-025-15163-6