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Charge carrier trapping and current conduction mechanisms in ZnGa2O4/n-SrTiO3 MOS capacitors.

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Title: Charge carrier trapping and current conduction mechanisms in ZnGa2O4/n-SrTiO3 MOS capacitors.
Authors: Karmakar, Subrata1,2, skarmakarph@gmail.com, Azmain, Mahfuz Ahmed1, Adedayo, Alaga1, Manikanthababu, Nethala1, Emu, Injamamul Hoque1, Droopad, Ravi1,3, Chen, Yihong1, Haque, Ariful1,3, ahaque@txstate.edu
Source: Journal of Materials Science: Materials in Electronics; Jun2025, Vol. 36 Issue 18, p1-15, 15p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 186271474
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Charge carrier trapping and current conduction mechanisms in ZnGa2O4/n-SrTiO3 MOS capacitors.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Jun2025, Vol. 36 Issue 18, p1-15, 15p
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        Value: 10.1007/s10854-025-15163-6
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      – Code: eng
        Text: English
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        PageCount: 15
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      – TitleFull: Charge carrier trapping and current conduction mechanisms in ZnGa2O4/n-SrTiO3 MOS capacitors.
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            NameFull: Karmakar, Subrata
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            NameFull: Azmain, Mahfuz Ahmed
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            NameFull: Emu, Injamamul Hoque
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              Text: Jun2025
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            – TitleFull: Journal of Materials Science: Materials in Electronics
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