APA (7th ed.) Citation

Volman Stern, M. O., Hohs, D., Jansche, A., Bernthaler, T., & Schneider, G. (2025). Synthetic dual image generation for reduction of labeling efforts in semantic segmentation of micrographs with a customized metric function. Methods in Microscopy, 2(2), 165. https://doi.org/10.1515/mim-2024-0016

Chicago Style (17th ed.) Citation

Volman Stern, Matias Oscar, Dominic Hohs, Andreas Jansche, Timo Bernthaler, and Gerhard Schneider. "Synthetic Dual Image Generation for Reduction of Labeling Efforts in Semantic Segmentation of Micrographs with a Customized Metric Function." Methods in Microscopy 2, no. 2 (2025): 165. https://doi.org/10.1515/mim-2024-0016.

MLA (9th ed.) Citation

Volman Stern, Matias Oscar, et al. "Synthetic Dual Image Generation for Reduction of Labeling Efforts in Semantic Segmentation of Micrographs with a Customized Metric Function." Methods in Microscopy, vol. 2, no. 2, 2025, p. 165, https://doi.org/10.1515/mim-2024-0016.