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Synthetic dual image generation for reduction of labeling efforts in semantic segmentation of micrographs with a customized metric function.

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Title: Synthetic dual image generation for reduction of labeling efforts in semantic segmentation of micrographs with a customized metric function.
Authors: Volman Stern, Matias Oscar1, matias_oscar.volmanstern@hs-aalen.de, Hohs, Dominic1, Dominic.Hohs@hs-aalen.de, Jansche, Andreas1, Andreas.Jansche@hs-aalen.de, Bernthaler, Timo1, Timo.Bernthaler@hs-aalen.de, Schneider, Gerhard1, Gerhard.Schneider@hs-aalen.de
Source: Methods in Microscopy; Jul2025, Vol. 2 Issue 2, p165-182, 18p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 186291456
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Synthetic dual image generation for reduction of labeling efforts in semantic segmentation of micrographs with a customized metric function.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=186291456
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1515/mim-2024-0016
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      – Code: eng
        Text: English
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        PageCount: 18
        StartPage: 165
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      – TitleFull: Synthetic dual image generation for reduction of labeling efforts in semantic segmentation of micrographs with a customized metric function.
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            NameFull: Volman Stern, Matias Oscar
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            NameFull: Hohs, Dominic
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            NameFull: Jansche, Andreas
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            NameFull: Bernthaler, Timo
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            NameFull: Schneider, Gerhard
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            – D: 01
              M: 07
              Text: Jul2025
              Type: published
              Y: 2025
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