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Comprehensive ellipsometric analysis of linear and nonlinear optical properties of GaAs for optoelectronic and communication applications.

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Title: Comprehensive ellipsometric analysis of linear and nonlinear optical properties of GaAs for optoelectronic and communication applications.
Authors: Isik, Mehmet1,2, mehmet.isik@bakircay.edu.tr, Gasanly, Nizami M.3,4
Source: Journal of Materials Science; Jul2025, Vol. 60 Issue 27, p11435-11445, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 186625964
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PubType: Academic Journal
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  Data: Comprehensive ellipsometric analysis of linear and nonlinear optical properties of GaAs for optoelectronic and communication applications.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%22">Journal of Materials Science</searchLink>; Jul2025, Vol. 60 Issue 27, p11435-11445, 11p
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s10853-025-11140-w
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 11435
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      – TitleFull: Comprehensive ellipsometric analysis of linear and nonlinear optical properties of GaAs for optoelectronic and communication applications.
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            NameFull: Isik, Mehmet
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            NameFull: Gasanly, Nizami M.
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              M: 07
              Text: Jul2025
              Type: published
              Y: 2025
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