View in EDS

C-SMART: A preprocessor for neural network performance and reliability under radiation.

Saved in:
Bibliographic Details
Title: C-SMART: A preprocessor for neural network performance and reliability under radiation.
Authors: Justus Rajappa, Anuj1, Reiter, Philippe1, Rech, Paolo2, Mercelis, Siegfried1, Famaey, Jeroen1
Source: Microelectronics Reliability; Oct2025, Vol. 173, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 187089090
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: C-SMART: A preprocessor for neural network performance and reliability under radiation.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Justus+Rajappa%2C+Anuj%22">Justus Rajappa, Anuj</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Reiter%2C+Philippe%22">Reiter, Philippe</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Rech%2C+Paolo%22">Rech, Paolo</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Mercelis%2C+Siegfried%22">Mercelis, Siegfried</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Famaey%2C+Jeroen%22">Famaey, Jeroen</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Microelectronics+Reliability%22">Microelectronics Reliability</searchLink>; Oct2025, Vol. 173, pN.PAG-N.PAG, 1p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=187089090
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.microrel.2025.115859
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 1
        StartPage: N.PAG
    Titles:
      – TitleFull: C-SMART: A preprocessor for neural network performance and reliability under radiation.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Justus Rajappa, Anuj
      – PersonEntity:
          Name:
            NameFull: Reiter, Philippe
      – PersonEntity:
          Name:
            NameFull: Rech, Paolo
      – PersonEntity:
          Name:
            NameFull: Mercelis, Siegfried
      – PersonEntity:
          Name:
            NameFull: Famaey, Jeroen
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 10
              Text: Oct2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 00262714
          Numbering:
            – Type: volume
              Value: 173
          Titles:
            – TitleFull: Microelectronics Reliability
              Type: main
ResultId 1