APA (7th ed.) Citation

Yang, Y., Tsung, E., Tai, Y., Chang, Y., Lai, C., & Lin, C. (2025). 28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode. SID Symposium Digest of Technical Papers, 56(1), 369. https://doi.org/10.1002/sdtp.18169

Chicago Style (17th ed.) Citation

Yang, Ya-Ru, En Tsung, Ya-Hsiang Tai, Yao-Chung Chang, Chih-Chang Lai, and Ching-Chun Lin. "28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode." SID Symposium Digest of Technical Papers 56, no. 1 (2025): 369. https://doi.org/10.1002/sdtp.18169.

MLA (9th ed.) Citation

Yang, Ya-Ru, et al. "28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode." SID Symposium Digest of Technical Papers, vol. 56, no. 1, 2025, p. 369, https://doi.org/10.1002/sdtp.18169.