View in EDS PDF Full Text

28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode.

Saved in:
Bibliographic Details
Title: 28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode.
Authors: Yang, Ya-Ru1, Tsung, En1, Tai, Ya-Hsiang1, Chang, Yao-Chung2, Lai, Chih-Chang2, Lin, Ching-Chun2
Source: SID Symposium Digest of Technical Papers; Jun2025, Vol. 56 Issue 1, p369-372, 4p
Database: Applied Science & Technology Source
FullText Links:
  – Type: pdflink
Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 187391488
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: 28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Yang%2C+Ya-Ru%22">Yang, Ya-Ru</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Tsung%2C+En%22">Tsung, En</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Tai%2C+Ya-Hsiang%22">Tai, Ya-Hsiang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chang%2C+Yao-Chung%22">Chang, Yao-Chung</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lai%2C+Chih-Chang%22">Lai, Chih-Chang</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lin%2C+Ching-Chun%22">Lin, Ching-Chun</searchLink><relatesTo>2</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22SID+Symposium+Digest+of+Technical+Papers%22">SID Symposium Digest of Technical Papers</searchLink>; Jun2025, Vol. 56 Issue 1, p369-372, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=187391488
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1002/sdtp.18169
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 369
    Titles:
      – TitleFull: 28‐4: Aftermarket Detection of Line Defects in Display Panels Using New TDDI with Testing Mode.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Yang, Ya-Ru
      – PersonEntity:
          Name:
            NameFull: Tsung, En
      – PersonEntity:
          Name:
            NameFull: Tai, Ya-Hsiang
      – PersonEntity:
          Name:
            NameFull: Chang, Yao-Chung
      – PersonEntity:
          Name:
            NameFull: Lai, Chih-Chang
      – PersonEntity:
          Name:
            NameFull: Lin, Ching-Chun
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 06
              Text: Jun2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 0097966X
          Numbering:
            – Type: volume
              Value: 56
            – Type: issue
              Value: 1
          Titles:
            – TitleFull: SID Symposium Digest of Technical Papers
              Type: main
ResultId 1