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Artificial neural network assisted spectroscopic ellipsometry data analysis of hydrogenated amorphous silicon thin films.

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Title: Artificial neural network assisted spectroscopic ellipsometry data analysis of hydrogenated amorphous silicon thin films.
Authors: Bordovalos, Alexander1, Alexander.Bordovalos@rockets.utoledo.edu, Kanneboina, Venkanna1, Dulal, Prabin1, Ramanujam, Balaji1, Shan, Ambalanath1, Podraza, Nikolas J.1, Alexander.Bordovalos@rockets.utoledo.edu
Source: Journal of Applied Physics; 9/7/2025, Vol. 138 Issue 9, p1-13, 13p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 187788190
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Artificial neural network assisted spectroscopic ellipsometry data analysis of hydrogenated amorphous silicon thin films.
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  Data: <searchLink fieldCode="AU" term="%22Bordovalos%2C+Alexander%22">Bordovalos, Alexander</searchLink><relatesTo>1</relatesTo>, <i>Alexander.Bordovalos@rockets.utoledo.edu</i><br /><searchLink fieldCode="AU" term="%22Kanneboina%2C+Venkanna%22">Kanneboina, Venkanna</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Dulal%2C+Prabin%22">Dulal, Prabin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Ramanujam%2C+Balaji%22">Ramanujam, Balaji</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Shan%2C+Ambalanath%22">Shan, Ambalanath</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Podraza%2C+Nikolas+J%2E%22">Podraza, Nikolas J.</searchLink><relatesTo>1</relatesTo>, <i>Alexander.Bordovalos@rockets.utoledo.edu</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; 9/7/2025, Vol. 138 Issue 9, p1-13, 13p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=187788190
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        Value: 10.1063/5.0278813
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      – Code: eng
        Text: English
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        PageCount: 13
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      – TitleFull: Artificial neural network assisted spectroscopic ellipsometry data analysis of hydrogenated amorphous silicon thin films.
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            NameFull: Bordovalos, Alexander
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            NameFull: Kanneboina, Venkanna
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            NameFull: Shan, Ambalanath
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            – D: 07
              M: 09
              Text: 9/7/2025
              Type: published
              Y: 2025
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