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Physics of sample charging during x-ray photoelectron spectroscopy: Insights from experiments with thin film insulators.

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Bibliographic Details
Title: Physics of sample charging during x-ray photoelectron spectroscopy: Insights from experiments with thin film insulators.
Authors: Greczynski, Grzegorz1, grzegorz.greczynski@liu.se
Source: Journal of Applied Physics; 9/7/2025, Vol. 138 Issue 9, p1-20, 20p
Database: Applied Science & Technology Source
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PubType: Academic Journal
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  Data: Physics of sample charging during x-ray photoelectron spectroscopy: Insights from experiments with thin film insulators.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=187788202
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        Value: 10.1063/5.0278529
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        Text: English
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              Text: 9/7/2025
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