Characterization of thermal boundary conductance of 2D–3D van der Waals interface using wideband transducerless frequency-domain thermoreflectance.
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| Title: | Characterization of thermal boundary conductance of 2D–3D van der Waals interface using wideband transducerless frequency-domain thermoreflectance. |
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| Authors: | Lu, Jialin1,2, Xie, Zhikun1,2, Chen, Runming2,3, Lin, Ziqi1,2, Lai, Tianshu1,2, Wang, Zixin2,3, Chen, Ke1,2, chenk35@mail.sysu.edu.cn |
| Source: | Journal of Applied Physics; 9/14/2025, Vol. 138 Issue 10, p1-12, 12p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 187951647 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Characterization of thermal boundary conductance of 2D–3D van der Waals interface using wideband transducerless frequency-domain thermoreflectance. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Lu%2C+Jialin%22">Lu, Jialin</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Xie%2C+Zhikun%22">Xie, Zhikun</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Chen%2C+Runming%22">Chen, Runming</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Lin%2C+Ziqi%22">Lin, Ziqi</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lai%2C+Tianshu%22">Lai, Tianshu</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Zixin%22">Wang, Zixin</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Chen%2C+Ke%22">Chen, Ke</searchLink><relatesTo>1,2</relatesTo>, <i>chenk35@mail.sysu.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; 9/14/2025, Vol. 138 Issue 10, p1-12, 12p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=187951647 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1063/5.0281403 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 12 StartPage: 1 Titles: – TitleFull: Characterization of thermal boundary conductance of 2D–3D van der Waals interface using wideband transducerless frequency-domain thermoreflectance. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Lu, Jialin – PersonEntity: Name: NameFull: Xie, Zhikun – PersonEntity: Name: NameFull: Chen, Runming – PersonEntity: Name: NameFull: Lin, Ziqi – PersonEntity: Name: NameFull: Lai, Tianshu – PersonEntity: Name: NameFull: Wang, Zixin – PersonEntity: Name: NameFull: Chen, Ke IsPartOfRelationships: – BibEntity: Dates: – D: 14 M: 09 Text: 9/14/2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 00218979 Numbering: – Type: volume Value: 138 – Type: issue Value: 10 Titles: – TitleFull: Journal of Applied Physics Type: main |
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