APA (7th ed.) Citation

Huber, J., Rahman, R., & Bandyopadhyay, S. (2025). Sensitivity of the Threshold Current for Switching of a Magnetic Tunnel Junction to Fabrication Defects and Its Application in Physical Unclonable Functions. Applied Sciences (2076-3417), 15(17), 9548. https://doi.org/10.3390/app15179548

Chicago Style (17th ed.) Citation

Huber, Jacob, Rahnuma Rahman, and Supriyo Bandyopadhyay. "Sensitivity of the Threshold Current for Switching of a Magnetic Tunnel Junction to Fabrication Defects and Its Application in Physical Unclonable Functions." Applied Sciences (2076-3417) 15, no. 17 (2025): 9548. https://doi.org/10.3390/app15179548.

MLA (9th ed.) Citation

Huber, Jacob, et al. "Sensitivity of the Threshold Current for Switching of a Magnetic Tunnel Junction to Fabrication Defects and Its Application in Physical Unclonable Functions." Applied Sciences (2076-3417), vol. 15, no. 17, 2025, p. 9548, https://doi.org/10.3390/app15179548.