APA (7th ed.) Citation

Glemža, J., Pliaterytė, I., Matukas, J., Gudaitis, R., Vasiliauskas, A., Jankauskas, Š., & Meškinis, Š. (2025). Low-Frequency Noise Characteristics of Graphene/h-BN/Si Junctions. Crystals (2073-4352), 15(9), 747. https://doi.org/10.3390/cryst15090747

Chicago Style (17th ed.) Citation

Glemža, Justinas, Ingrida Pliaterytė, Jonas Matukas, Rimantas Gudaitis, Andrius Vasiliauskas, Šarūnas Jankauskas, and Šarūnas Meškinis. "Low-Frequency Noise Characteristics of Graphene/h-BN/Si Junctions." Crystals (2073-4352) 15, no. 9 (2025): 747. https://doi.org/10.3390/cryst15090747.

MLA (9th ed.) Citation

Glemža, Justinas, et al. "Low-Frequency Noise Characteristics of Graphene/h-BN/Si Junctions." Crystals (2073-4352), vol. 15, no. 9, 2025, p. 747, https://doi.org/10.3390/cryst15090747.