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Low-Frequency Noise Characteristics of Graphene/h-BN/Si Junctions.

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Title: Low-Frequency Noise Characteristics of Graphene/h-BN/Si Junctions.
Authors: Glemža, Justinas1, Pliaterytė, Ingrida1,2, Matukas, Jonas1, Gudaitis, Rimantas2, Vasiliauskas, Andrius2, Jankauskas, Šarūnas2, Meškinis, Šarūnas2, sarunas.meskinis@ktu.lt
Source: Crystals (2073-4352); Sep2025, Vol. 15 Issue 9, p747, 16p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 188281051
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PubTypeId: academicJournal
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  Data: Low-Frequency Noise Characteristics of Graphene/h-BN/Si Junctions.
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      – Type: doi
        Value: 10.3390/cryst15090747
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      – Code: eng
        Text: English
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        PageCount: 16
        StartPage: 747
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      – TitleFull: Low-Frequency Noise Characteristics of Graphene/h-BN/Si Junctions.
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            – D: 01
              M: 09
              Text: Sep2025
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              Y: 2025
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