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SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN Accelerators.

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Title: SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN Accelerators.
Authors: Pappalardo, Salvatore1, salvatore.pappalardo@ec-lyon.fr, Bellarmino, Nicolo'2, nicolo.bellarmino@polito.it, Deveautour, Bastien3, bastien.deveautour@univ-nantes.fr, Bosio, Alberto1, Taheri, Mahdi4,5, Daneshtalab, Masoud4,6, Raik, Jaan4, Jenihhin, Maksim4
Source: Journal of Circuits, Systems & Computers; 12/1/2025, Vol. 34 Issue 18, p1-23, 23p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 188426545
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN Accelerators.
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  Data: <searchLink fieldCode="AU" term="%22Pappalardo%2C+Salvatore%22">Pappalardo, Salvatore</searchLink><relatesTo>1</relatesTo>, <i>salvatore.pappalardo@ec-lyon.fr</i><br /><searchLink fieldCode="AU" term="%22Bellarmino%2C+Nicolo'%22">Bellarmino, Nicolo'</searchLink><relatesTo>2</relatesTo>, <i>nicolo.bellarmino@polito.it</i><br /><searchLink fieldCode="AU" term="%22Deveautour%2C+Bastien%22">Deveautour, Bastien</searchLink><relatesTo>3</relatesTo>, <i>bastien.deveautour@univ-nantes.fr</i><br /><searchLink fieldCode="AU" term="%22Bosio%2C+Alberto%22">Bosio, Alberto</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Taheri%2C+Mahdi%22">Taheri, Mahdi</searchLink><relatesTo>4,5</relatesTo><br /><searchLink fieldCode="AU" term="%22Daneshtalab%2C+Masoud%22">Daneshtalab, Masoud</searchLink><relatesTo>4,6</relatesTo><br /><searchLink fieldCode="AU" term="%22Raik%2C+Jaan%22">Raik, Jaan</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Jenihhin%2C+Maksim%22">Jenihhin, Maksim</searchLink><relatesTo>4</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Circuits%2C+Systems+%26+Computers%22">Journal of Circuits, Systems & Computers</searchLink>; 12/1/2025, Vol. 34 Issue 18, p1-23, 23p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=188426545
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        Value: 10.1142/S0218126625430017
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