APA (7th ed.) Citation

Teo, T., Mei, K., & Yuen, T. Y. P. (2025). A Markerless Photogrammetric Framework with Spatio-Temporal Refinement for Structural Deformation and Strain Monitoring. Buildings (2075-5309), 15(19), 3584. https://doi.org/10.3390/buildings15193584

Chicago Style (17th ed.) Citation

Teo, Tee-Ann, Ko-Hsin Mei, and Terry Y. P. Yuen. "A Markerless Photogrammetric Framework with Spatio-Temporal Refinement for Structural Deformation and Strain Monitoring." Buildings (2075-5309) 15, no. 19 (2025): 3584. https://doi.org/10.3390/buildings15193584.

MLA (9th ed.) Citation

Teo, Tee-Ann, et al. "A Markerless Photogrammetric Framework with Spatio-Temporal Refinement for Structural Deformation and Strain Monitoring." Buildings (2075-5309), vol. 15, no. 19, 2025, p. 3584, https://doi.org/10.3390/buildings15193584.