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A Markerless Photogrammetric Framework with Spatio-Temporal Refinement for Structural Deformation and Strain Monitoring.

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Title: A Markerless Photogrammetric Framework with Spatio-Temporal Refinement for Structural Deformation and Strain Monitoring.
Authors: Teo, Tee-Ann1, tateo@nycu.edu.tw, Mei, Ko-Hsin1, Yuen, Terry Y. P.1
Source: Buildings (2075-5309); Oct2025, Vol. 15 Issue 19, p3584, 35p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 188676371
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: A Markerless Photogrammetric Framework with Spatio-Temporal Refinement for Structural Deformation and Strain Monitoring.
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  Data: <searchLink fieldCode="JN" term="%22Buildings+%282075-5309%29%22">Buildings (2075-5309)</searchLink>; Oct2025, Vol. 15 Issue 19, p3584, 35p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=188676371
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        Value: 10.3390/buildings15193584
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      – Code: eng
        Text: English
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        PageCount: 35
        StartPage: 3584
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      – TitleFull: A Markerless Photogrammetric Framework with Spatio-Temporal Refinement for Structural Deformation and Strain Monitoring.
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            NameFull: Teo, Tee-Ann
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            NameFull: Mei, Ko-Hsin
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            – D: 01
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              Text: Oct2025
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