APA (7th ed.) Citation

Kochubei, H. K., Stronski, A. V., Dzhagan, V. M., Shportko, K. V., Selyshchev, O., Shamrovska, P., & Zahn, D. R. T. (2025). Raman scattering and X-ray diffraction studies of Ge16Sb24Se60 alloys. Semiconductor Physics, Quantum Electronics & Optoelectronics, 28(3), 300. https://doi.org/10.15407/spqeo28.03.300

Chicago Style (17th ed.) Citation

Kochubei, H. K., A. V. Stronski, V. M. Dzhagan, K. V. Shportko, O. Selyshchev, P. Shamrovska, and D. R. T. Zahn. "Raman Scattering and X-ray Diffraction Studies of Ge16Sb24Se60 Alloys." Semiconductor Physics, Quantum Electronics & Optoelectronics 28, no. 3 (2025): 300. https://doi.org/10.15407/spqeo28.03.300.

MLA (9th ed.) Citation

Kochubei, H. K., et al. "Raman Scattering and X-ray Diffraction Studies of Ge16Sb24Se60 Alloys." Semiconductor Physics, Quantum Electronics & Optoelectronics, vol. 28, no. 3, 2025, p. 300, https://doi.org/10.15407/spqeo28.03.300.