Raman scattering and X-ray diffraction studies of Ge16Sb24Se60 alloys.
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| Title: | Raman scattering and X-ray diffraction studies of Ge16Sb24Se60 alloys. |
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| Authors: | Kochubei, H. K.1, kochubei.hanna@gmail.com, Stronski, A. V.1, alexander.stronski@gmail.com, Dzhagan, V. M.1, dzhagan@isp.kiev.ua, Shportko, K. V.1, k.shportko@ukr.net, Selyshchev, O.2, oleksandr.selyshchev@physik.tu-chemnitz.de, Shamrovska, P.2, pshamrovska@gmail.com, Zahn, D. R. T.2, zahn@physik.tu-chemnitz.de |
| Source: | Semiconductor Physics, Quantum Electronics & Optoelectronics; 2025, Vol. 28 Issue 3, p300-305, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 15608034 |
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| DOI: | 10.15407/spqeo28.03.300 |
