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Raman scattering and X-ray diffraction studies of Ge16Sb24Se60 alloys.

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Title: Raman scattering and X-ray diffraction studies of Ge16Sb24Se60 alloys.
Authors: Kochubei, H. K.1, kochubei.hanna@gmail.com, Stronski, A. V.1, alexander.stronski@gmail.com, Dzhagan, V. M.1, dzhagan@isp.kiev.ua, Shportko, K. V.1, k.shportko@ukr.net, Selyshchev, O.2, oleksandr.selyshchev@physik.tu-chemnitz.de, Shamrovska, P.2, pshamrovska@gmail.com, Zahn, D. R. T.2, zahn@physik.tu-chemnitz.de
Source: Semiconductor Physics, Quantum Electronics & Optoelectronics; 2025, Vol. 28 Issue 3, p300-305, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 188706525
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  Data: Raman scattering and X-ray diffraction studies of Ge16Sb24Se60 alloys.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=188706525
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