Raman scattering and X-ray diffraction studies of Ge16Sb24Se60 alloys. - Kochubei, H. K.; Stronski, A. V.; Dzhagan, V. M.; Shportko, K. V.; Selyshchev, O.; Shamrovska, P.; Zahn, D. R. T. (Semiconductor Physics, Quantum Electronics & Optoelectronics, 2025)