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A concentration phenomenon for h-extra edge-connectivity reliability analysis of enhanced hypercubes Qn,2 with exponentially many faulty links.

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Title: A concentration phenomenon for h-extra edge-connectivity reliability analysis of enhanced hypercubes Qn,2 with exponentially many faulty links.
Authors: Sun, Yali1, ylisun@163.com, Zhang, Mingzu1, mzuzhang@163.com, Feng, Xing2, fengxingfm@163.com, Yang, Xing3, xyang4@monroecc.edu
Source: Fundamenta Informaticae; 2025, Vol. 194 Issue 1, p1-21, 20p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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  Data: A concentration phenomenon for h-extra edge-connectivity reliability analysis of enhanced hypercubes Qn,2 with exponentially many faulty links.
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  Data: <searchLink fieldCode="AU" term="%22Sun%2C+Yali%22">Sun, Yali</searchLink><relatesTo>1</relatesTo>, <i>ylisun@163.com</i><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Mingzu%22">Zhang, Mingzu</searchLink><relatesTo>1</relatesTo>, <i>mzuzhang@163.com</i><br /><searchLink fieldCode="AU" term="%22Feng%2C+Xing%22">Feng, Xing</searchLink><relatesTo>2</relatesTo>, <i>fengxingfm@163.com</i><br /><searchLink fieldCode="AU" term="%22Yang%2C+Xing%22">Yang, Xing</searchLink><relatesTo>3</relatesTo>, <i>xyang4@monroecc.edu</i>
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  Data: <searchLink fieldCode="JN" term="%22Fundamenta+Informaticae%22">Fundamenta Informaticae</searchLink>; 2025, Vol. 194 Issue 1, p1-21, 20p
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        Value: 10.46298/fi.13487
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      – Code: eng
        Text: English
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            NameFull: Sun, Yali
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            NameFull: Zhang, Mingzu
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            NameFull: Feng, Xing
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              Text: 2025
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              Y: 2025
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              Value: 194
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