A concentration phenomenon for h-extra edge-connectivity reliability analysis of enhanced hypercubes Qn,2 with exponentially many faulty links.

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Bibliographic Details
Title:	A concentration phenomenon for h-extra edge-connectivity reliability analysis of enhanced hypercubes Qn,2 with exponentially many faulty links.
Authors:	Sun, Yali¹, ylisun@163.com, Zhang, Mingzu¹, mzuzhang@163.com, Feng, Xing², fengxingfm@163.com, Yang, Xing³, xyang4@monroecc.edu
Source:	Fundamenta Informaticae; 2025, Vol. 194 Issue 1, p1-21, 20p
Database:	Applied Science & Technology Source

Description
ISSN:	01692968
DOI:	10.46298/fi.13487