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Sharpness-aware minimization with physics-informed regularizations for predicting semiconductor material properties in molecular dynamics.

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Bibliographic Details
Title: Sharpness-aware minimization with physics-informed regularizations for predicting semiconductor material properties in molecular dynamics.
Authors: Shin, Dong-Hee1, Son, Young-Han1, Kam, Tae-Eui1, kamte@korea.ac.kr
Source: Chemometrics & Intelligent Laboratory Systems; Dec2025, Vol. 267, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
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