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Embedding Intelligence at the Sensor: Naïve Bayes Classifier for Real-Time Fault Diagnosis in Resource-Constrained WSNs.

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Bibliographic Details
Title: Embedding Intelligence at the Sensor: Naïve Bayes Classifier for Real-Time Fault Diagnosis in Resource-Constrained WSNs.
Authors: Aitamar, Yassine1, yassine.aitamar@um5r.ac.ma, Oubaha, Jawad2, El Abbadi, Jamal1
Source: International Journal of Online & Biomedical Engineering; 2025, Vol. 21 Issue 13, p46-62, 17p
Database: Applied Science & Technology Source
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