Bibliographic Details
| Title: |
Engineering Electrical Transport by Implantation‐Induced Defects in CrN Films Without Affecting Thermal Conductivity. |
| Authors: |
Bouteiller, Hugo1,2, bouteillerh@ornl.gov, Poterie, Charlotte1, Burcea, Razvan3, Fournier, Danièle4, Ezzahri, Younès1, Dubois, Sylvain1, Eklund, Per5,6, le Febvrier, Arnaud5,6, arnaud.lefebvrier@kemi.uu.se, Barbot, Jean‐François1, jean.francois.barbot@univ-poitiers.fr |
| Source: |
Advanced Materials Interfaces; 11/22/2025, Vol. 12 Issue 22, p1-12, 12p |
| Database: |
Applied Science & Technology Source |
