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Engineering Electrical Transport by Implantation‐Induced Defects in CrN Films Without Affecting Thermal Conductivity.

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Bibliographic Details
Title: Engineering Electrical Transport by Implantation‐Induced Defects in CrN Films Without Affecting Thermal Conductivity.
Authors: Bouteiller, Hugo1,2, bouteillerh@ornl.gov, Poterie, Charlotte1, Burcea, Razvan3, Fournier, Danièle4, Ezzahri, Younès1, Dubois, Sylvain1, Eklund, Per5,6, le Febvrier, Arnaud5,6, arnaud.lefebvrier@kemi.uu.se, Barbot, Jean‐François1, jean.francois.barbot@univ-poitiers.fr
Source: Advanced Materials Interfaces; 11/22/2025, Vol. 12 Issue 22, p1-12, 12p
Database: Applied Science & Technology Source
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