A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT. - Seniushin, Igor; Glazyrina, Natalya; Atanbayev, Yernat; Bairamov, Kamal; Satiyeva, Yenlik; Nurman, Olzhas; Altaibek, Mamyr (Applied Sciences (2076-3417), 2025)