Defect analysis of Sn-doped Ga2O3/SiC hetero-structured Schottky diodes using deep level transient spectroscopy. - Lee, Tae-Hee; Choi, Ji-Soo; Park, Se-Rim; Chung, Seung-Hwan; Lee, Geon-Hee; Lim, Jae Hyeok; Bae, Si-Young; Koo, Sang-Mo (Journal of Applied Physics, 2025)