APA (7th ed.) Citation

Tan, J. J., Schreiner, R., Hausladen, M., Asgharzade, A., Edler, S., Bartsch, J., . . . Hum, Y. (2025). SiMiC: Context-aware silicon microstructure characterization using attention-based convolutional neural networks for field-emission tip analysis. Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, 43(6), 1. https://doi.org/10.1116/6.0005068

Chicago Style (17th ed.) Citation

Tan, Jing Jie, et al. "SiMiC: Context-aware Silicon Microstructure Characterization Using Attention-based Convolutional Neural Networks for Field-emission Tip Analysis." Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics 43, no. 6 (2025): 1. https://doi.org/10.1116/6.0005068.

MLA (9th ed.) Citation

Tan, Jing Jie, et al. "SiMiC: Context-aware Silicon Microstructure Characterization Using Attention-based Convolutional Neural Networks for Field-emission Tip Analysis." Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, vol. 43, no. 6, 2025, p. 1, https://doi.org/10.1116/6.0005068.