SiMiC: Context-aware silicon microstructure characterization using attention-based convolutional neural networks for field-emission tip analysis. - Tan, Jing Jie; Schreiner, Rupert; Hausladen, Matthias; Asgharzade, Ali; Edler, Simon; Bartsch, Julian; Bachmann, Michael; Schels, Andreas; Kwan, Ban-Hoe; Ng, Danny Wee-Kiat; Hum, Yan-Chai (Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, 2025)