Spectroscopic Ellipsometry and Luminescence Properties of Low Temperature Sputter-Deposited Zinc Oxide Thin Films: Cryogenic Self-Stress-Induced Crystallization.
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| Title: | Spectroscopic Ellipsometry and Luminescence Properties of Low Temperature Sputter-Deposited Zinc Oxide Thin Films: Cryogenic Self-Stress-Induced Crystallization. |
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| Authors: | Ebdah, M. A.1, emohammad@alcorn.edu, Kordesch, M. E.2, Yuan, W.3, Jadwisienczak, W. M.3,4, Kaya, S.3,5, Nazzal, M. D.4,6, Ibdah, A.1,5, Al-iqdah, K. S.2,6 |
| Source: | Crystals (2073-4352); Dec2025, Vol. 15 Issue 12, p1031, 21p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 20734352 |
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| DOI: | 10.3390/cryst15121031 |
