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Spectroscopic Ellipsometry and Luminescence Properties of Low Temperature Sputter-Deposited Zinc Oxide Thin Films: Cryogenic Self-Stress-Induced Crystallization.

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Title: Spectroscopic Ellipsometry and Luminescence Properties of Low Temperature Sputter-Deposited Zinc Oxide Thin Films: Cryogenic Self-Stress-Induced Crystallization.
Authors: Ebdah, M. A.1, emohammad@alcorn.edu, Kordesch, M. E.2, Yuan, W.3, Jadwisienczak, W. M.3,4, Kaya, S.3,5, Nazzal, M. D.4,6, Ibdah, A.1,5, Al-iqdah, K. S.2,6
Source: Crystals (2073-4352); Dec2025, Vol. 15 Issue 12, p1031, 21p
Database: Applied Science & Technology Source
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  Data: Spectroscopic Ellipsometry and Luminescence Properties of Low Temperature Sputter-Deposited Zinc Oxide Thin Films: Cryogenic Self-Stress-Induced Crystallization.
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  Data: <searchLink fieldCode="JN" term="%22Crystals+%282073-4352%29%22">Crystals (2073-4352)</searchLink>; Dec2025, Vol. 15 Issue 12, p1031, 21p
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        Value: 10.3390/cryst15121031
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              Text: Dec2025
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