Wang, L., Zhang, D., He, Y., & Deng, Y. (2025). Direct Detailed Surface Structure Imaging of Mesoporous Silica by Low-Voltage Scanning Electron Microscopy. Applied Sciences (2076-3417), 15(23), 12845. https://doi.org/10.3390/app152312845
Chicago Style (17th ed.) CitationWang, Lei, Dechang Zhang, Yonghong He, and Yu Deng. "Direct Detailed Surface Structure Imaging of Mesoporous Silica by Low-Voltage Scanning Electron Microscopy." Applied Sciences (2076-3417) 15, no. 23 (2025): 12845. https://doi.org/10.3390/app152312845.
MLA (9th ed.) CitationWang, Lei, et al. "Direct Detailed Surface Structure Imaging of Mesoporous Silica by Low-Voltage Scanning Electron Microscopy." Applied Sciences (2076-3417), vol. 15, no. 23, 2025, p. 12845, https://doi.org/10.3390/app152312845.