Bibliographic Details
| Title: |
痕量探测与 X-CT 成像融合安检技术的研究进展. (Chinese) |
| Authors: |
陈昶卓1,2, ccz23@mails.tsinghua.edu.cn, 陈志强1,2, czq@mail.tsinghua.edu.cn |
| Source: |
CT Theory & Applications; Nov2025, Vol. 34 Issue 6, p979-993, 15p |
| Database: |
Applied Science & Technology Source |
